TSMC Transfers 195 U.S. Patents to Parabellum Strategic Opportunities Fund

Patents Poised for Licensing or Enforcement in Semiconductor Sector

(Source: https://www.tsmcmoi.com/en/)

By PatenTrip

Taiwan Semiconductor Manufacturing Company Limited (TSMC) transferred 195 U.S. patents to Parabellum Strategic Opportunities Fund LLC, a Delaware-based entity, in July 2024. 

The transferred patents predominantly focus on advanced technologies in the semiconductor and microelectronics industries.

The patents encompass critical innovations in the design, manufacturing, and packaging of semiconductor devices, including processors, memory devices, and integrated circuits (ICs). They are categorized into six primary technology groups: Semiconductor Device Design and Fabrication, Semiconductor Packaging and Interconnects, Advanced Lithography and Etching Processes, Thermal and Mechanical Reliability, Image Sensor Technologies, and Circuit Interconnects and Integration.

Potential applications for these patents span areas such as Advanced Chip Manufacturing, 3D Packaging, Thermal and Reliability Solutions, and Optoelectronics. 

Despite no patent infringement lawsuits filed by Parabellum to date, the transfer suggests possible monetization strategies through licensing, enforcement actions, or strategic collaborations within the semiconductor industry.

(Source: USPTO)


The following is a detailed list of application numbers and invention titles for the 195 U.S. patents transferred by TSMC to Parabellum Strategic Opportunities Fund LLC. (Source: USPTO)

Application Invention title

11531290 METHODS FOR FABRICATING IMAGE SENSOR DEVICES

11945022 STRUCTURES FOR PREVENTING CROSS-TALK BETWEEN THROUGH-SILICON VIAS AND INTEGRATED CIRCUITS

12423422 CHEMICAL MECHANICAL POLISHING (CMP) METHOD FOR GATE LAST PROCESS

12536629 NOVEL HIGH-K METAL GATE CMOS PATTERNING METHOD

12619468 COPPER BUMP JOINT STRUCTURES WITH IMPROVED CRACK RESISTANCE

12706809 INTEGRATED SEMICONDUCTOR STRUCTURE FOR SRAM AND FABRICATION METHODS THEREOF

12710441 METHODS FOR FABRICATING IMAGE SENSOR DEVICES

12713395 NOVEL STRUCTURES AND METHODS TO STOP CONTACT METAL FROM EXTRUDING INTO REPLACEMENT GATES

12731411 INTEGRATED CIRCUIT INCLUDING FINFETS AND METHODS FOR FORMING THE SAME

12769725 PROTECTION LAYER FOR ADHESIVE MATERIAL AT WAFER EDGE

12781960 PACKAGE SYSTEMS HAVING INTERPOSERS WITH INTERCONNECTION STRUCTURES

12823851 EMBEDDED 3D INTERPOSER STRUCTURE

12831925 CONTROLLING THE SHAPE OF SOURCE/DRAIN REGIONS IN FINFETS

12837093 FIN-LIKE FIELD EFFECT TRANSISTOR (FINFET) DEVICE AND METHOD OF MANUFACTURING SAME

12842304 ROBUST JOINT STRUCTURE FOR FLIP-CHIP BONDING

12904506 CONDUCTIVE PILLAR STRUCTURE

12906820 FIN-LIKE FIELD EFFECT TRANSISTOR (FINFET) DEVICE AND METHOD OF MANUFACTURING SAME

12953130 MOLDED CHIP INTERPOSER STRUCTURE AND METHODS

13007235 DISTRIBUTED METAL ROUTING

13025414 END-TO-END GAP FILL USING DIELECTRIC FILM

13035517 PREVENTING THE CRACKING OF PASSIVATION LAYERS ON ULTRA-THICK METALS

13101890 ADAPTIVE FIN DESIGN FOR FINFETS

13112828 SEMICONDUCTOR DEVICE HAVING A BONDING PAD AND SHIELD STRUCTURE OF DIFFERENT THICKNESS

13156558 CHEMICAL MECHANICAL POLISHING (CMP) METHOD FOR GATE LAST PROCESS

13210962 INTEGRATED CIRCUITS

13273527 SELECTIVE FIN-SHAPING PROCESS USING PLASMA DOPING AND ETCHING FOR 3-DIMENSIONAL TRANSISTOR APPLICATIONS

13346995 Structures for Preventing Cross-talk Between Through-Silicon Vias and Integrated Circuits

13362913 BUMP STRUCTURAL DESIGNS TO MINIMIZE PACKAGE DEFECTS

13436149 METHODS AND APPARATUS FOR SRAM CELL STRUCTURE

13475297 METAL GATE FINFET DEVICE AND METHOD OF FABRICATING THEREOF

13487860 STRAINED STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE STRAINED STRUCTURE

13559840 Elongated Bumps in Integrated Circuit Devices

13560200 PROTECTION LAYER FOR ADHESIVE MATERIAL AT WAFER EDGE

13563470 SEMICONDUCTOR INTEGRATED CIRCUIT WITH METAL GATE

13691093 Controlling the Shape of Source/Drain Regions in FinFETs

13710377 INTEGRATED SEMICONDUCTOR STRUCTURE FOR SRAM AND FABRICATION METHODS THEREOF

13712665 MOLDED CHIP INTERPOSER STRUCTURE AND METHODS

13715684 FinFET with Embedded MOS Varactor and Method of Making Same

13745205 SEMICONDUCTOR DEVICE HAVING MODIFIED PROFILE METAL GATE

13757510 Fin-Like Field Effect Transistor (FinFET) Device and Method of Manufacturing Same

13772008 BACK SIDE ILLUMINATION (BSI) SENSORS, MANUFACTURING METHODS THEREOF, AND SEMICONDUCTOR DEVICE MANUFACTURING METHODS

13787465 BUMP STRUCTURES FOR SEMICONDUCTOR PACKAGE

13800663 END-TO-END GAP FILL USING DIELECTRIC FILM

13864676 PROTECTION LAYER FOR ADHESIVE MATERIAL AT WAFER EDGE

13867831 EMBEDDED 3D INTERPOSER STRUCTURE

13962180 METHODS TO STOP CONTACT METAL FROM EXTRUDING INTO REPLACEMENT GATES

13974430 INTERCONNECT STRUCTURE AND METHOD FOR FORMING THE SAME

14016996 MECHANISMS FOR FORMING IMAGE SENSOR DEVICE

14147851 SEMICONDUCTOR DEVICE AND FORMATION THEREOF

14163302 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

14206248 PACKAGES WITH THROUGH-VIAS HAVING TAPERED ENDS

14208744 BUMP STRUCTURE AND METHOD FOR FORMING THE SAME

14210817 BUMP STRUCTURAL DESIGNS TO MINIMIZE PACKAGE DEFECTS

14215296 SEMICONDUCTOR DEVICE HAVING A BONDING PAD AND SHIELD STRUCTURE AND METHOD OF MANUFACTURING THE SAME

14220930 Adaptive Fin Design for FinFETs

14276784 SEMICONDUCTOR PACKAGE AND METHOD

14447223 METHOD OF MANUFACTURING A FIN-LIKE FIELD EFFECT TRANSISTOR (FINFET) DEVICE

14464315 MULTI-GATE DEVICE STRUCTURE INCLUDING A FIN-EMBEDDED ISOLATION REGION AND METHODS THEREOF

14495399 METHOD OF FORMING PACKAGE SYSTEMS HAVING INTERPOSERS

14510706 INTEGRATED CIRCUITS AND METHODS OF FORMING INTEGRATED CIRCUITS

14584783 METAL GATE FINFET DEVICE

14598276 SELECTIVE FIN-SHAPING PROCESS

14609031 Controlling the Shape of Source/Drain Regions in FinFETs

14615264 INTERCONNECT STRUCTURE AND METHOD FOR FORMING THE SAME

14657312 SOURCE/DRAIN REGIONS FOR FIN FIELD EFFECT TRANSISTORS AND METHODS OF FORMING SAME

14715112 Methods and Apparatus for SRAM Cell Structure

14719090 FINFET WITH EMBEDDED MOS VARACTOR AND METHOD OF MAKING SAME

14720824 Distributed Metal Routing

14725555 STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE

14739418 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

14830089 METHOD AND STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING GATE SPACER PROTECTION LAYER

14836019 SELF-ALIGNED BACK SIDE DEEP TRENCH ISOLATION STRUCTURE

14839047 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

14875923 METHOD OF MAKING A STRAINED STRUCTURE OF A SEMICONDUCTOR DEVICE

14879710 BUMP STRUCTURAL DESIGNS TO MINIMIZE PACKAGE DEFECTS

14879880 METHOD FOR FORMING PACKAGE SYSTEMS HAVING INTERPOSERS

14927218 METHODS OF FORMING MULTI-DIE PACKAGE STRUCTURES INCLUDING REDISTRIBUTION LAYERS

14928604 IMAGE SENSOR WITH WIDE CONTACT

14937529 FIN-LIKE FIELD EFFECT TRANSISTOR (FINFET) DEVICE AND METHOD OF MANUFACTURING SAME

14941215 STRUCTURE AND FORMATION METHOD FOR CHIP PACKAGE

14952733 SEMICONDUCTOR DEVICE HAVING MODIFIED PROFILE METAL GATE

14985504 LID STRUCTURE FOR A SEMICONDUCTOR DEVICE PACKAGE AND METHOD FOR FORMING THE SAME

15064402 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

15130032 SEMICONDUCTOR DEVICE AND FORMATION THEREOF

15135185 Methods and Apparatus for SRAM Cell Structure

15171322 INTEGRATED CIRCUITS AND METHODS OF FORMING INTEGRATED CIRCUITS

15210343 CHIP PACKAGE WITH THERMAL DISSIPATION STRUCTURE AND METHOD FOR FORMING THE SAME

15213179 Multi-Gate Device Structure Including a Fin-Embedded Isolation Region and Methods Thereof

15414264 SOURCE/DRAIN REGIONS FOR FIN FIELD EFFECT TRANSISTORS AND METHODS OF FORMING SAME

15414449 Structure and Formation Method of Semiconductor Device with Metal Gate

15429844 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH SEPARATED MERGED SOURCE/DRAIN STRUCTURE

15472814 METHOD FOR MANUFACTURING IMAGE SENSOR STRUCTURE HAVING WIDE CONTACT

15492059 SEMICONDUCTOR DEVICE

15597452 METHOD OF FORMING ABSORPTION ENHANCEMENT STRUCTURE FOR IMAGE SENSOR

15609206 Thermal Interface Material Having Different Thicknesses In Packages

15614274 Method of Fabricating a Semiconductor Device Having Modified Profile Metal Gate

15652012 STRUCTURE AND FORMATION METHOD FOR CHIP PACKAGE

15658588 SELF-ALIGNED BACK SIDE DEEP TRENCH ISOLATION STRUCTURE

15668315 PACKAGES WITH THROUGH-VIAS HAVING TAPERED ENDS

15692212 Vias for Cobalt-Based Interconnects and Methods of Fabrication Thereof

15700468 Structure and Method for FinFET Device with Asymmetric Contact

15706141 Methods of Forming Multi-Die Package Structures Including Redistribution Layers

15714167 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

15719395 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

15719500 SEMICONDUCTOR STRUCTURE AND ASSOCIATED FABRICATING METHOD

15719511 SEMICONDUCTOR PACKAGES AND METHODS OF FORMING THE SAME

15800962 PACKAGING WITH SUBSRTATES CONNECTED BY CONDUCTIVE BUMPS

15804311 Method for Forming a Lid Structure for a Semiconductor Device Package

15820961 METHOD AND STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING GATE SPACER PROTECTION LAYER

15898785 Fin-Like Field Effect Transistor (FinFET) Device and Method of Manufacturing Same

15906092 SEMICONDUCTOR DEVICE HAVING A LINER LAYER WITH A CONFIGURED PROFILE AND METHOD OF FABRICATING THEREOF

15957914 PACKAGE ON PACKAGE STRUCTURE

16008302 SRAM STRUCTURE

16014821 Embedded 3D Interposer Structure

16017795 STRUCTURE OF SEMICONDUCTOR DEVICE STRUCTURE HAVING FINS

16035910 PACKAGES WITH THROUGH-VIAS HAVING TAPERED ENDS

16043371 SEMICONDUCTOR STRUCTURE WITH SOURCE/DRAIN MULTI-LAYER STRUCTURE AND METHOD FOR FORMING THE SAME

16043510 STRUCTURE AND METHOD FOR FINFET DEVICE WITH ASYMMETRIC CONTACT

16049015 Thermal Interface Material Having Different Thicknesses in Packages

16049059 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH SEPARATED MERGED SOURCE/DRAIN STRUCTURE

16118744 Method and Structure for Semiconductor Device Having Gate Spacer Protection Layer

16124337 METHOD FOR FORMING BUMP STRUCTURE

16136339 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

16138099 Integrated Circuit Package and Method

16164752 CHIP PACKAGE AND METHOD OF FORMING THE SAME

16190608 ABSORPTION ENHANCEMENT STRUCTURE FOR IMAGE SENSOR

16226088 SEMICONDUCTOR DEVICE INCLUDING A LINER LAYER BETWEEN A CHANNEL AND A SOURCE/DRAIN EPITAXIAL LAYER

16420576 ABSORPTION ENHANCEMENT STRUCTURE FOR IMAGE SENSOR

16511176 GATE-ALL-AROUND STRUCTURE AND METHODS OF FORMING THE SAME

16530404 SRAM STRUCTURE AND METHOD FOR MANUFACTURING SRAM STRUCTURE

16564317 STRUCTURE AND METHOD FOR FINFET DEVICE WITH ASYMMETRIC CONTACT

16572438 SEMICONDUCTOR DEVICE HAVING MODIFIED PROFILE METAL GATE

16585636 Structure and Method for Semiconductor Devices

16593382 Embedded 3D Interposer Structure

16654175 SEMICONDUCTOR STRUCTURE WITH SOURCE/DRAIN MULTI-LAYER STRUCTURE AND METHOD FOR FORMING THE SAME

16661675 SEMICONDUCTOR STRUCTURE AND ASSOCIATED FABRICATING METHOD

16671563 Fin-Like Field Effect Transistor (FinFET) Device and Method of Manufacturing Same

16689101 PACKAGE ON PACKAGE STRUCTURE

16693627 ABSORPTION ENHANCEMENT STRUCTURE FOR IMAGE SENSOR

16696645 SEMICONDUCTOR DEVICE HAVING A LINER LAYER WITH A CONFIGURED PROFILE

16707908 Integrated Circuit Package and Method

16720853 Vias for Cobalt-Based Interconnects and Methods of Fabrication Thereof

16739868 MEMORY DEVICE AND METHOD OF FABRICATING THE MEMORY DEVICE

16782858 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

16829295 Packages with Through-Vias Having Tapered Ends

16871983 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

16902190 Structure of Semiconductor Device Structure Having Fins

16933541 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING A LINER LAYER WITH A CONFIGURED PROFILE

16937901 SEMICONDUCTOR DEVICE

16940264 MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE

16983752 Structure and Method for FinFET Device with Asymmetric Contact

17002042 ABSORPTION ENHANCEMENT STRUCTURE FOR IMAGE SENSOR

17012255 Thermal Interface Material Having Different Thicknesses in Packages

17028683 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME

17068389 Multi-Die Package Structures Including Redistribution Layers

17079863 SRAM STRUCTURE AND METHOD FOR MANUFACTURING SRAM STRUCTURE

17103611 SEMICONDUCTOR STRUCTURE AND ASSOCIATED FABRICATING METHOD

17107484 Method and Structure for Semiconductor Device Having Gate Spacer Protection Layer

17155467 SEMICONDUCTOR STRUCTURE WITH SOURCE/DRAIN MULTI-LAYER STRUCTURE AND METHOD FOR FORMING THE SAME

17175816 Gate-All-Around Structure and Methods of Forming the Same

17200272 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

17244598 Integrated Circuit Package and Method

17301467 SEMICONDUCTOR DEVICE HAVING MODIFIED PROFILE METAL GATE

17316582 GATE ALL-AROUND SEMICONDUCTOR DEVICE

17401728 MEMORY DEVICE AND METHOD OF FABRICATING THE MEMORY DEVICE

17590409 Structure and Method for Semiconductor Devices

17664129 CONTACT STRUCTURE OF A SEMICONDUCTOR DEVICE

17672719 PACKAGE ON PACKAGE STRUCTURE

17730213 CHIP PACKAGE AND METHOD OF FORMING THE SAME

17814842 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

17815839 VIAS FOR COBALT-BASED INTERCONNECTS AND METHODS OF FABRICATION THEREOF

17827457 Structure and Method for FinFET Device with Asymmetric Contact

17833373 SEMICONDUCTOR DEVICE STRUCTURE WITH SOURCE/DRAIN STRUCTURE

17837704 Method and Structure for Semiconductor Device Having Gate Spacer Protection Layer

17873962 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

17874170 SEMICONDUCTOR DEVICE

17980914 Integrated Circuit Package and Method

18063711 SEMICONDUCTOR STRUCTURE WITH SOURCE/DRAIN MULTI-LAYER STRUCTURE AND METHOD FOR FORMING THE SAME

18305584 Gate-All-Around Structure and Methods of Forming the Same

18312844 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

18313190 Structure of Semiconductor Device Structure Having Fins

18337044 CHIP PACKAGE AND METHOD OF FORMING THE SAME

18338364 SEMICONDUCTOR STRUCTURE AND ASSOCIATED FABRICATING METHOD

18360508 Structure and Method for Semiconductor Devices

18422550 THERMAL INTERFACE MATERIAL HAVING DIFFERENT THICKNESSES IN PACKAGES

18444959 Vias for Cobalt-Based Interconnects and Methods of Fabrication Thereof

18519862 CONTACT STRUCTURE OF A SEMICONDUCTOR DEVICE

18598250 MULTI-DIE PACKAGE STRUCTURES INCLUDING REDISTRIBUTION LAYERS

18637874 SEMICONDUCTOR STRUCTURE WITH SOURCE/DRAIN MULTI-LAYER STRUCTURE AND METHOD FOR FORMING THE SAME

18656133 Structure and Method for FinFET Device with Asymmetric Contact

18659033 PACKAGE ON PACKAGE STRUCTURE

18662544 SEMICONDUCTOR DEVICE

18676539 MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE

18733499 GATE-ALL-AROUND STRUCTURE AND METHODS OF FORMING THE SAME

18733674 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

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